On Comparison of NCR Effectiveness with a Reduced I{DDQ} Vector Set
نویسندگان
چکیده
IDDQ test-based outlier rejection becomes difficult for deep sub-micron technology chips due to increased leakage and process variations. The use of Neighbor Current Ratio (NCR) that uses wafer-level spatial correlation for identifying outlier chips has been proposed earlier as a means of coping with these issues. Due to the slow speed of IDDQ test, there is a strong motivation to reduce the number of test vectors without compromising the fault coverage. In this paper, we examine the effectiveness of Neighbor Current Ratio using a reduced IDDQ vector set and industrial test data.
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